Technical Name |
High-performance In0.53Ga0.47As FinFETs using nitrogen-based plasma treatments for RF Applications |
Project Operator |
National Chiao Tung University |
Project Host |
張翼 |
Summary |
We propose advanced nitrogen-based passivation techniques, including plasma-enhanced atomic layer deposition (PEALD) aluminum nitride (AlN)in-situ remote-plasma (RP) treatment using nitrogen (N2) gas,demonstrate the high-performancesufficiently reliable In0.53Ga0.47As FinFETs for radio frequency (RF) applications.
|
Scientific Breakthrough |
InGaAs materials are suitable for RF applications, enabling high-frequencylow-noise functionality. However, InGaAs FinFETs inherit low quality of InGaAs surface/interface of fin structures. in this work, we propose an advanced nitrogen-based plasma treatmentsdemonstrate high-performance InGaAs FinFET technology enabling the scaled devices matching the requirements of high-frequency RF ap |
Industrial Applicability |
These InGaAs FinFET technologies with high frequency response can be used for next-generation network systems, communications,aerospace (with frequency signal between 100-340 GHz). It can be integrate with the state-of-the-art Si CMOS used for many THz imaging applications such as medical diagnostic, health treatment, security,sensor systems.
|
Keyword |
High-κ III-V InGaAs MOSFET FinFET interface PEALD remote-plasma treatment cut-off frequency maximum oscillation frequency |