Technical Name Advanced high-range measuring platform for wafer inspection
Project Operator National Taiwan University
Project Host 陳亮嘉
Summary
The advanced high-accuracy measuring platform is integrated by precision metrology, nano-position control techniqueCAD. To inspect the 12 inch wafer, the measuring range of the platform is 300mm×300mm×5mm. The long traveling range with nano scale resolution is a original technique in Taiwan. Due to the high expensebulky size of commercially laser interferometer, we developed a miniaturiz
Scientific Breakthrough
-
Industrial Applicability
-
Keyword
other people also saw