Technical Name | Advanced high-range measuring platform for wafer inspection | ||
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Project Operator | National Taiwan University | ||
Project Host | 陳亮嘉 | ||
Summary | The advanced high-accuracy measuring platform is integrated by precision metrology, nano-position control techniqueCAD. To inspect the 12 inch wafer, the measuring range of the platform is 300mm×300mm×5mm. The long traveling range with nano scale resolution is a original technique in Taiwan. Due to the high expensebulky size of commercially laser interferometer, we developed a miniaturiz |
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Scientific Breakthrough | - |
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Industrial Applicability | - |
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Keyword |