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    • Wafer Level Probing System for Semiconductor Gas Sensor with High Throughput

      AI & IOT Application Innotech Expo Wafer Level Probing System for Semiconductor Gas Sensor with High Throughput

      This probing equipment is integrated by the opto-mechanical, electricalvacuum systematic technologies to efficiently measure the electric properties of gas sensor chips at wafer level. Therefore, we can identify the functionality of each sensor chip in early phasethen discard the unqualified chips to enhance the production efficiencyproducts competition.
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