| Technical Name | Optical Inspection System for Chip Surface Defects | ||
|---|---|---|---|
| Project Operator | National Applied Research Labroratories | ||
| Project Host | - | ||
| Summary | ITRC developed a serious equipment of Optical Inspection System for Chip Surface Defects integrated with packaging machines. Systems have capabilities of optical imagingrecognition efficiently to meet the requests of high inspecting accuracy. The chip sorters integrated with optical inspection system can detect chips defects automatically during the process of sorting. Then the manpower, micr |
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| Scientific Breakthrough | - |
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| Industrial Applicability | - |
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| Keyword | |||
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