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    • In-situ Large-scale X-ray Mirror Measurement Technology

      Electronic & Optoelectronics FutureTech In-situ Large-scale X-ray Mirror Measurement Technology

      The long trace profiler (LTP) can be used to measure the figureintermediate frequency roughness of an X-ray mirror. The measurement process is accurate, high-speednon-contact. The radius of curvature for the measurement may be ranged from a value from 5 m to infinity, such that the surface profile feature can be measured in the range with a longitudinal resolution of 0.15 nm.
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