The long trace profiler (LTP) can be used to measure the figureintermediate frequency roughness of an X-ray mirror. The measurement process is accurate, high-speednon-contact. The radius of curvature for the measurement may be ranged from a value from 5 m to infinity, such that the surface profile feature can be measured in the range with a longitudinal resolution of 0.15 nm.

"1. Automatically generate Verilog code tools based on the hardware architecture of convolutional neural networks: 4 different hardware architectures (output stationary, weight stationary, Tree architecture, NVDLA) can be generated for the currently more commonly used DNN networks. 2. Visual performance index analysis tool: According to the selected DNN model,the choice of hardware architecture specifications, analyze the performance index."