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    • High-Security IC Test Technology with Dynamic Keys

      Electronic & Optoelectronics FutureTech High-Security IC Test Technology with Dynamic Keys

      We proposed a dynamic-key secure DFT structure that can generate the keys dynamicallydefend scan-basedmemory attacks without decreasing the system performancethe testability. Analysis results show that our method can achieve a very high security levelthe security level will not decrease no matter how many times the attacker guesses due to the dynamic characteristic of our method.
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