The graphene film detection system device of this patent is relatively simple. Compared with the conventional graphene layer detection method, the specific substrate thickness and structure are not required, and the parameters of the algorithm are relatively clear and simple, and there is no need to control the illumination source of the microscope. Color changes enable the detection and analysis of graphene thin films.

Raman can change the intensity of a G-band and change the Raman frequency of a 2D-band.The transmission spectrum is obtained by measuring the transmittance of the layer information.The single-layer graphene has a penetration of 97.7%.Atomic force microscopy can determine the roughness of the surface. In contrast, optical microscopy provides fast imaging speeds that can be used as a quick and intuitive way to visualize the graphite layer and obtain relevant information about multilayer graphene. This creation uses multi-spectral color image reproduction technology and is matched with microscopes, CCDs, and other devices.It can be applied to the rapid detection and identification of low-layer graphene on transparent substrates or other industries (such as yield and quality).

現今的技術，在辨識少層數石墨烯的視覺對比上仍有待加強。我們的方法則是利用多頻譜色彩再現影像的檢測石墨烯薄膜流程，解決上述的量測時間過長、量測的不確定性、需要特定的基板厚度與結構及少層數石墨烯的視覺對比不足的問題。